In our company, we provide calibration of all devices for measuring ESD space. These calibrations are done on-site or in our laboratory, based on the client's requirements. We calibrate primarily these devices:
Diagnostics of Electronic Structures, DPS, and Components
The most commonly used methods of diagnostics of electronic structures, DPS, and components are optical, electron, fluorescence, laser, and AFM microscopy. The analysis can include a selection of an area in order to prepare materialographic cuts. We also provide diagnostics of DPS, LTCC, and other connecting structures.
Active and passive components
De-capsulation of chips
Mechanical defects (fractures, cracks)
Solderability Testing of DPS and Components
We use solderability testers MUST in our laboratory for wiring structures in order to confirm the compatibility of lead-free soldering alloys and surface treatment of components and printed circuit boards. Tester is equipped with nitrogen cover providing an inert atmosphere and imitates real-life conditions.
Dip and Look Test Wetting Balance Test Flow Test Lead-free Solder SAC305
Other Electrotechnical Analysis
Diagnostics of electrical insulation systems and on-line monitoring
Determination of glass transition temperature, melting temperature, determination of thermal or weight stability of materials, analysis of released gases accompanying thermal decomposition of materials, measurement of longitudinal thermal expansion
Monitoring of technological discipline and monitoring the quality of supplies
Microscopy (laser confocal, fluorescent, optical, electron), 3D measurement
Materialography and image analysis
Diagnostics of electronic components, PCB, and wiring structures